Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Applied Mathematics
سال: 2015
ISSN: 1110-757X,1687-0042
DOI: 10.1155/2015/851837